Power Electronics The typical time of rising time lies between 40 - 60 µs. 1 - 4 µs. 10 - 20 µs. 90 - 100 µs. 40 - 60 µs. 1 - 4 µs. 10 - 20 µs. 90 - 100 µs. ANSWER DOWNLOAD EXAMIANS APP
Power Electronics During reverse recovery time charge carrier of junction J2 recombined. both B and C. charge carrier of junction J1 is swept out. charge carrier of junction J3 is swept out. charge carrier of junction J2 recombined. both B and C. charge carrier of junction J1 is swept out. charge carrier of junction J3 is swept out. ANSWER DOWNLOAD EXAMIANS APP
Power Electronics A power semiconductor may undergo damage due to High di/dt. High dv/dt. Low dv/dt. Low di/dt. High di/dt. High dv/dt. Low dv/dt. Low di/dt. ANSWER DOWNLOAD EXAMIANS APP
Power Electronics During gate recovery time charge carriers of J3 junction is removed. charge carrier of J1 junction removed. charge carriers of J2 junction is swept out. charge carriers of J2 junction recombined. charge carriers of J3 junction is removed. charge carrier of J1 junction removed. charge carriers of J2 junction is swept out. charge carriers of J2 junction recombined. ANSWER DOWNLOAD EXAMIANS APP
Power Electronics By which one of the following we can measure the reliability of a string? Derating factor. Reliability factor. String efficient. Factor of safety. Derating factor. Reliability factor. String efficient. Factor of safety. ANSWER DOWNLOAD EXAMIANS APP
Power Electronics BCT is used for Low power phase control. High power current control. Low power current control. High power phase control. Low power phase control. High power current control. Low power current control. High power phase control. ANSWER DOWNLOAD EXAMIANS APP
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