Automation System
Semiconductor devices:

All of these
None of these
have a very short infant mortality period
are less reliable than electro¬mechanical components
usually have a very short MTBF (mean time between failure)

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Automation System
Pressure sensors:

None of these
use the piezoresistive effect in strain gauge sensors
All of these
use an aneroid chamber with a variable resistance output
use capacitive variations to sense pressure

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