Automation System
Localizing an object in an image and selectively analyzing the object in a series of redundant layers is referred to as the:

None of these
Maxwell pyramid
Turing test
pyramid
Gaussian pyramid

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Automation System
Semiconductor devices:

have a very short infant mortality period
All of these
are less reliable than electro¬mechanical components
None of these
usually have a very short MTBF (mean time between failure)

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